Mathematical Models of Radiation Transparency of Test Objects When Using Sandwich X-Ray Radiation Detectors

被引：0
|
作者：
V. A. Udod
S. E. Vorobeichikov
S. Yu. Nazarenko
机构：
[1] Tomsk State University,
[2] Tomsk Polytechnic University,undefined
来源：
Russian Journal of Nondestructive Testing | 2020年 / 56卷
关键词：
X-ray radiation; inspection control; effective atomic number; material recognition; dual-energy method; sandwich detector;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
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页码：161 / 170
页数：9
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