Side-Channel Analysis for the Re-Keying Protocol of Bluetooth Low Energy

被引:0
|
作者
Pei Cao
Chi Zhang
Xiang-Jun Lu
Hai-Ning Lu
Da-Wu Gu
机构
[1] Shanghai Jiao Tong University,School of Electronic Information and Electrical Engineering
关键词
Bluetooth low energy (BLE/BTLE); long term key; re-keying protocol; side-channel analysis;
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暂无
中图分类号
学科分类号
摘要
In the era of the Internet of Things, Bluetooth low energy (BLE/BTLE) plays an important role as a well-known wireless communication technology. While the security and privacy of BLE have been analyzed and fixed several times, the threat of side-channel attacks to BLE devices is still not well understood. In this work, we highlight a side-channel threat to the re-keying protocol of BLE. This protocol uses a fixed long term key for generating session keys, and the leakage of the long term key could render the encryption of all the following (and previous) connections useless. Our attack exploits the side-channel leakage of the re-keying protocol when it is implemented on embedded devices. In particular, we present successful correlation electromagnetic analysis and deep learning based profiled analysis that recover long term keys of BLE devices. We evaluate our attack on an ARM Cortex-M4 processor (Nordic Semiconductor nRF52840) running Nimble, a popular open-source BLE stack. Our results demonstrate that the long term key can be recovered within only a small amount of electromagnetic traces. Further, we summarize the features and limitations of our attack, and suggest a range of countermeasures to prevent it.
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页码:1132 / 1148
页数:16
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