Efficient techniques for fault detection and location of multiple controlled Toffoli-based reversible circuit

It is very important to detect and correct faults for ensuring the validity and reliability of these circuits. In this regard, a comparative study with related existing techniques is undertaken. Two techniques to achieve the testability of reversible circuits are introduced that have been improved in terms of quantum cost and fault coverage rate. Considering this aspect, the main focus of these techniques is on the efficient detection and location of faults with 100% accuracy. These techniques for fault detection in reversible circuit design, in addition to being able to produce the correct outputs, can also provide information for fault location that has already been done at a higher cost. Proposed approaches have been successfully tested for all types of SMGF, MMGF, PMGF, RGF, and SBF. In order to verify the functional correctness of the proposed scheme, it also has executed the testing over a reversible full adder circuit, and findings are checked. In the following, the proposed approach of reversible sequential circuits is presented for the first time so far. The cost metrics are evaluated for all the proposed designs and compared the estimated results against some existing design approaches of reversible circuits for better understanding.