The role of transient resonances for ultra-fast imaging of single sucrose nanoclusters

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作者
Phay J. Ho
Benedikt J. Daurer
Max F. Hantke
Johan Bielecki
Andre Al Haddad
Maximilian Bucher
Gilles Doumy
Ken R. Ferguson
Leonie Flückiger
Tais Gorkhover
Bianca Iwan
Christopher Knight
Stefan Moeller
Timur Osipov
Dipanwita Ray
Stephen H. Southworth
Martin Svenda
Nicusor Timneanu
Anatoli Ulmer
Peter Walter
Janos Hajdu
Linda Young
Filipe R. N. C. Maia
Christoph Bostedt
机构
[1] Argonne National Laboratory,Chemical Sciences and Engineering Division
[2] Uppsala University,Laboratory of Molecular Biophysics, Department of Cell and Molecular Biology
[3] Oxford University,Chemistry Research Laboratory, Department of Chemistry
[4] European XFEL GmbH,Linac Coherent Light Source
[5] SLAC National Accelerator Laboratory,ARC Centre of Excellence for Advanced Molecular Imaging
[6] La Trobe University,Stanford Pulse Institute
[7] SLAC National Accelerator Laboratory,Computational Science Division
[8] Argonne National Laboratory,Department of Physics and Astronomy
[9] Uppsala University,Institut für Optik und Atomare Physik
[10] Technische Universität Berlin,Department of Physics and James Franck Institute
[11] The University of Chicago,Department of Physics and Astronomy
[12] Northwestern University,LUXS Laboratory for Ultrafast X
[13] Paul-Scherrer Institute,ray Sciences, Institute of Chemical Sciences and Engineering
[14] École Polytechnique Fédérale de Lausanne (EPFL),undefined
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摘要
Intense x-ray free-electron laser (XFEL) pulses hold great promise for imaging function in nanoscale and biological systems with atomic resolution. So far, however, the spatial resolution obtained from single shot experiments lags averaging static experiments. Here we report on a combined computational and experimental study about ultrafast diffractive imaging of sucrose clusters which are benchmark organic samples. Our theoretical model matches the experimental data from the water window to the keV x-ray regime. The large-scale dynamic scattering calculations reveal that transient phenomena driven by non-linear x-ray interaction are decisive for ultrafast imaging applications. Our study illuminates the complex interplay of the imaging process with the rapidly changing transient electronic structures in XFEL experiments and shows how computational models allow optimization of the parameters for ultrafast imaging experiments.
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