Preparation of Reference Glasses for in-situ Analysis of Lithium and Boron

被引：1
|
作者：
Brieuc Le Fevre
Luisa Ottolini
机构：
[1] CNR-Istituto di Geoscienze e Georisorse (IGG),
[2] Sezione di Pavia,undefined
来源：
Microchimica Acta | 2006年 / 155卷
关键词：
Key words: Standard Reference Material; SIMS; lithium; boron.;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
In recent years there has been an increasing number of applications of micro-analytical techniques, such as Secondary-Ion Mass Spectrometry (SIMS) and Laser Ablation-ICP-MS, in the field of Earth Sciences. As a consequence, the need of well characterised calibration standards, which are a prerequisite for these techniques, has increased considerably. Such a request is particularly critical to SIMS due to the existence of matrix effects in the ion micro-probe analysis.
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页码：189 / 194
页数：5
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