Applications of near-infrared spectroscopy to process analysis using fourier transform spectrometer

被引:0
|
作者
Masahiro Watari
机构
[1] Yokogawa Electric Corporation,
来源
Optical Review | 2010年 / 17卷
关键词
near-IR spectroscopy; NIR; Fourier transform spectrometer; FT-NIR; process application;
D O I
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中图分类号
学科分类号
摘要
The applications of near-IR spectroscopy to process analysis using a Fourier transform spectrometer are described. In recent years, process analysis based on near-IR spectroscopy has received keen interest from a growing number of industries. Some configurations of Fourier transform near infrared (FT-NIR) interferometers used for process analysis are introduced as special optical systems for the realization of stable and reproducible performance. Moreover, the applications of NIR spectroscopy to process analysis using FT-NIR spectrometers are overviewed and two examples of applications are described in more detail. Furthermore, process analytical technology (PAT) for the pharmaceutical industry is introduced as a future trend of the application of FT-NIR spectroscopy, and a dual-wavelength system that can combine NIR and IR spectra is discussed as a newly proposed PAT tool for understanding processes.
引用
收藏
页码:317 / 322
页数:5
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