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- [21] Electromigration in Eutectic Tin-Bismuth Bottom-Terminated-Component Solder Joints PROCEEDINGS OF THE IEEE 74TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTC 2024, 2024, : 1433 - 1438
- [22] Microstructural Evolution and Shear Properties Degradation of Tin-Lead/Copper Solder Joints at Cryogenic Temperatures 2023 24TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT, 2023,
- [23] Influence of Bismuth on the Solidification of Tin Copper Lead-Free Solder Alloy 4TH ELECTRONIC AND GREEN MATERIALS INTERNATIONAL CONFERENCE 2018 (EGM 2018), 2018, 2045
- [25] Influence of IMC on the interface failure of tin-silver-copper solder joints Jixie Qiandu/Journal of Mechanical Strength, 2005, 27 (05): : 666 - 671
- [28] TEM study of Bi segregation in the interconnect of eutectic tin-bismuth solder and copper ICEPT: 2007 8TH INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING TECHNOLOGY, PROCEEDINGS, 2007, : 765 - 767