Development of a Seebeck coefficient Standard Reference Material

被引：0

作者：

Nathan D. Lowhorn

W. Wong-Ng

Z. Q. Lu

E. Thomas

M. Otani

M. Green

N. Dilley

J. Sharp

T. N. Tran

机构：

[1] National Institute of Standards and Technology,Ceramics Division

[2] National Institute of Standards and Technology,Statistical Engineering Division

[3] Quantum Design,undefined

[4] Marlow Industries,undefined

[5] Inc.,undefined

[6] Naval Surface Warfare Center,undefined

来源：

Applied Physics A | 2009年 / 96卷

关键词：

66.70.Df; 72.15.Jf; 72.15.Eb; 72.00.00; 72.15.-v;

D O I：

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中图分类号：

学科分类号：

摘要：

We have successfully developed a Seebeck coefficient Standard Reference Material (SRM™), Bi2Te3, that is crucial for inter-laboratory data comparison and for instrument calibration. Certification measurements were performed using two different techniques on 10 samples randomly selected from a batch of 390 bars. The certified Seebeck coefficient values are provided from 10 to 390 K. The availability of this SRM will validate the measurement accuracy, leading to a better understanding of the structure/property relationships, and the underlying physics of new and improved thermoelectric materials. An overview of the measurement techniques and data analysis is given.

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页码：511 / 514

页数：3

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