Development of a Seebeck coefficient Standard Reference Material

被引：0
|
作者：
Nathan D. Lowhorn
W. Wong-Ng
Z. Q. Lu
E. Thomas
M. Otani
M. Green
N. Dilley
J. Sharp
T. N. Tran
机构：
[1] National Institute of Standards and Technology,Ceramics Division
[2] National Institute of Standards and Technology,Statistical Engineering Division
[3] Quantum Design,undefined
[4] Marlow Industries,undefined
[5] Inc.,undefined
[6] Naval Surface Warfare Center,undefined
来源：
Applied Physics A | 2009年 / 96卷
关键词：
66.70.Df; 72.15.Jf; 72.15.Eb; 72.00.00; 72.15.-v;
D O I：
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学科分类号：
摘要：
We have successfully developed a Seebeck coefficient Standard Reference Material (SRM™), Bi2Te3, that is crucial for inter-laboratory data comparison and for instrument calibration. Certification measurements were performed using two different techniques on 10 samples randomly selected from a batch of 390 bars. The certified Seebeck coefficient values are provided from 10 to 390 K. The availability of this SRM will validate the measurement accuracy, leading to a better understanding of the structure/property relationships, and the underlying physics of new and improved thermoelectric materials. An overview of the measurement techniques and data analysis is given.
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页码：511 / 514
页数：3
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