Complementary Metal-Oxide Semiconductor (CMOS) Image Sensor: An Insight as a Point-of-Care Label-Free Immunosensor

被引：0

作者：

Karthikeyan Kandasamy

Mohana Marimuthu

Gun Yong Sung

Chang Geun Ahn

Sanghyo Kim

机构：

[1] Kyungwon University,College of Bionanotechnology

[2] Electronics and Telecommunications Research Institute (ETRI),BT Convergence Technology Research Department

来源：

Analytical Sciences | 2010年 / 26卷

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学科分类号：

摘要：

The present paper examines the efficiency of a complementary metal-oxide semiconductor (CMOS) using an indium nanoparticle (InNP) substrate for the high-sensitivity detection of antigen/antibody interactions at concentrations as low as 100 pg/ml under normal light. Metal NPs coated with antigen/antibody layers act as a dielectric layer on the conducting sphere, which enhances the number of photons hitting the sensor surface through a light-scattering effect. This photon number is proportional to the digital number observed with the CMOS sensor for detecting antigen/antibody interactions.

引用

页码：1215 / 1217

页数：2

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