Electric field effect and atomic manipulation process with the probe tip of a scanning tunneling microscope

被引：0
|
作者：
X. Bouju
M. Devel
C. Girard
机构：
[1] Laboratoire de Physique Moléculaire,
[2] UMR CNRS 6624,undefined
[3] Université de Franche-Comté,undefined
[4] F-25030 Besançon Cedex,undefined
[5] France (E-mail: xavier.bouju@univ-fcomte.fr),undefined
[6] Centre d’Élaboration des Matériaux et d’Études Structurales,undefined
[7] UPR CNRS 8011,undefined
[8] 29,undefined
[9] rue Jeanne-Marvig,undefined
[10] Boîte Postale 4347,undefined
[11] F-31055 Toulouse Cedex,undefined
[12] France,undefined
来源：
Applied Physics A | 1998年 / 66卷
关键词：
PACS: 34.20.Cf; 61.16.Ch; 61.20.Le; 68.35.Bs;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：S749 / S752
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