Automated measuring system based on high-precision Talystep profilometer for monitoring surface-roughness standards

被引：0
|
作者：
Poroshin V.V. [1 ]
Bogomolov D.Y. [1 ]
Kostyuk A.G. [1 ]
机构：
[1] Moscow State Industrial University, Moscow
来源：
Russian Engineering Research | 2010年 / 30卷 / 6期
关键词：
RUSSIAN Engineer Research; Amplification Factor; Digital Input; Signal Collection; Digital Line;
D O I：
10.3103/S1068798X10060262
中图分类号：
学科分类号：
摘要：
[No abstract available]
引用
收藏
页码：642 / 644
页数：2
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