Defect formation and annealing processes in fullerene C60 at T = (4000–6000) K are studied using molecular dynamics with a tight-binding potential. The cluster lifetime until fragmentation, which proceeds, as a rule, through the loss of a C2 dimer, has been found as a function of temperature. The activation energy and the frequency factor in the Arrhenius equation for the fragmentation rate have been found to be Ea = (9.2 ± 0.4) eV and A = (8 ± 1) × 1019s−1. It is shown that fragmentation can occur already after the C60 cluster loses its spherical shape. This fact must be taken into account in theoretical calculations of Ea.