Utilization of electrical instability for the nondestructive testing of aging in metal-insulator-metal structures

被引：0
|
作者：
V. M. Bogomol'nyii
机构：
来源：
Measurement Techniques | 1999年 / 42卷
关键词：
Electric Displacement; Electrical Breakdown; Strong Electric Field; Dielectric Strength; Secondary Electron Emission;
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学科分类号：
摘要：
The influence of the electronic subsystem and polarization of dielectrics on their dielectric strength is investigated. It is shown on the basis of Poincaré limit cycles that the aging of dielectrics has a wavelike character. It follows from the reported experimental and theoretical data that the application of an external static electric field to metal-insulator-metal (MIM) structures leads to self-excitation, which can serve as an indicator of degradation of a dielectric.
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页码：794 / 800
页数：6
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