Reflection and mode conversion of surface acoustic waves studied by scanning acoustic force microscopy

被引：0
|
作者：
G. Behme
T. Hesjedal
机构：
[1] Paul Drude Institute for Solid State Electronics,
[2] Hausvogteiplatz 5–7,undefined
[3] 10117 Berlin,undefined
[4] Germany,undefined
[5] Solid State and Photonics Lab,undefined
[6] CIS–X,undefined
[7] Stanford University,undefined
[8] Stanford,undefined
[9] CA 94305,undefined
[10] USA,undefined
来源：
Applied Physics A | 2001年 / 72卷
关键词：
PACS: 07.79.V; 68.35.G; 43.35.Cg; 43.58;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
We present measurements of the reflection and mode conversion of surface acoustic waves (SAWs) by scanning acoustic force microscopy (SAFM). The SAFM offers a unique combination of high lateral resolution and high sensitivity towards acoustic modes of all polarizations. Since a SAW mixing experiment of two waves can be performed even if the amplitude difference between both waves is 40 dB, wavefields of extremely small amplitudes can be investigated. Using SAFM, the reflection of SAWs from a metallic wedge is investigated with submicron lateral resolution. We are able to identify two reflected wave modes, a Love and a non-coupling Rayleigh mode, by measuring their phase velocities.
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页码：491 / 493
页数：2
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