Influence of the Self-Heating Effect on the I–V Characteristics of Field Transistors on a Silicon-on-Insulator Structure at High Temperatures

被引：0
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作者：
N. V. Masalskii
机构：
[1] Scientific Research Institute of System Analysis,
[2] Russian Academy of Sciences,undefined
来源：
Journal of Communications Technology and Electronics | 2020年 / 65卷
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页码：962 / 965
页数：3
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