Lateral Force Microscopy of Interfacial Nanobubbles: Friction Reduction and Novel Frictional Behavior

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作者
Chih-Wen Yang
Kwan-tai Leung
Ren-Feng Ding
Hsien-Chen Ko
Yi-Hsien Lu
Chung-Kai Fang
Ing-Shouh Hwang
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[1] Academia Sinica,Institute of Physics
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Atomic force microscopy is used to conduct single-asperity friction measurements at a water-graphite interface. Local mapping of the frictional force, which is based on the degree of the cantilever twisting, shows nearly friction-free when a tip scans over a nanobubble. Surprisingly, apart from being gapless, the associated friction loop exhibits a tilt in the cantilever twisting versus the tip’s lateral displacement with the slope depending on the loading force. The sign of the slope reverses at around zero loading force. In addition, the measured normal and lateral tip-sample interactions exhibit unison versus tip-sample separation. Theoretical analysis, based on the balance of forces on the tip originated from the capillary force of the nanobubble and the torsion of the cantilever, offers quantitative explanations for both the tilted friction loop and the unison of force curves. The analysis may well apply in a wider context to the lateral force characterization on cap-shaped fluid structures such as liquid droplets on a solid substrate. This study further points to a new direction for friction reduction between solids in a liquid medium.
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