Foam films and wetting films on quartz formed from aqueous solutions of cetyltrimethylammonium bromide (CTAB) are investigated in a wide range of surfactant concentrations in the presence of background electrolyte (5 × 10–4 mol dm–3 NaCl). Foam and wetting films are convenient models for the study of symmetric (free thin liquid films) and asymmetric (thin liquid films on solid substrate) films with the same air/solution interface. Microinterferometric methods of assessment of foam and wetting films are used which allow precise determination of the film thickness. Determined are the values of the potential ϕ0 of the diffuse electrical layer at the solution/air interface (applying the method of “equilibrium foam films”) and the potential ϕ1 at the solution/quartz interface (applying the method of capillary electrokinetics). These values are used to analyze the stability of the films studied in terms of the DLVO theory. A conclusion drawn is that both kinds of films studied are stabilized by electrostatic interaction forces. It is shown that with increasing CTAB concentration, a charge reversal occurs at both the solution/air and solution/quartz interfaces which determines the stability/instability conditions of the foam and wetting films. Concentration ranges where both kinds of films produce stable (equilibrium) films are found. There are also concentration ranges where the films either rupture or are metastable (quasi-equilibrium). The CTAB concentration ranges, which provide the formation of unstable (rupturing and metastable) and stable films, are different for symmetric (foam) and asymmetric (wetting) thin liquid films. It is only at high CTAB concentrations (higher that > 2 × 10–4 mol dm–3) that both cases render formation of stable equilibrium films. These studies give direct experimental indications that the electrostatic interactions between identical or different interfaces can differ when the surfactant concentration is varied.