Ultra-long-working-distance spectroscopy of single nanostructures with aspherical solid immersion microlenses

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作者
Aleksander Bogucki
Łukasz Zinkiewicz
Magdalena Grzeszczyk
Wojciech Pacuski
Karol Nogajewski
Tomasz Kazimierczuk
Aleksander Rodek
Jan Suffczyński
Kenji Watanabe
Takashi Taniguchi
Piotr Wasylczyk
Marek Potemski
Piotr Kossacki
机构
[1] University of Warsaw,Faculty of Physics
[2] National Institute for Materials Science,Laboratoire National des Champs Magnétiques Intenses
[3] CNRS-UJF-UPS-INSA,undefined
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摘要
In light science and applications, equally important roles are played by efficient light emitters/detectors and by the optical elements responsible for light extraction and delivery. The latter should be simple, cost effective, broadband, versatile and compatible with other components of widely desired micro-optical systems. Ideally, they should also operate without high-numerical-aperture optics. Here, we demonstrate that all these requirements can be met with elliptical microlenses 3D printed on top of light emitters. Importantly, the microlenses we propose readily form the collected light into an ultra-low divergence beam (half-angle divergence below 1°) perfectly suited for ultra-long-working-distance optical measurements (600 mm with a 1-inch collection lens), which are not accessible to date with other spectroscopic techniques. Our microlenses can be fabricated on a wide variety of samples, including semiconductor quantum dots and fragile van der Waals heterostructures made of novel two-dimensional materials, such as monolayer and few-layer transition metal dichalcogenides.
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