Scaling limits of loop-erased random walks and uniform spanning trees

被引:1
|
作者
Oded Schramm
机构
[1] The Weizmann Institute of Science,Department of Mathematics
来源
关键词
Span Tree; Conformal Invariance; Scaling Limit; Simple Path; Simple Random Walk;
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学科分类号
摘要
The uniform spanning tree (UST) and the loop-erased random walk (LERW) are strongly related probabilistic processes. We consider the limits of these models on a fine grid in the plane, as the mesh goes to zero. Although the existence of scaling limits is still unproven, subsequential scaling limits can be defined in various ways, and do exist. We establish some basic a.s. properties of these subsequential scaling limits in the plane. It is proved that any LERW subsequential scaling limit is a simple path, and that the trunk of any UST subsequential scaling limit is a topological tree, which is dense in the plane.
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页码:221 / 288
页数:67
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