Broadband high-resolution X-ray frequency combs

被引:0
|
作者
Cavaletto, Stefano M. [1 ]
Harman, Zoltan [1 ]
Ott, Christian [1 ]
Buth, Christian [1 ]
Pfeifer, Thomas [1 ]
Keitel, Christoph H. [1 ]
机构
[1] Max Planck Inst Kernphys, D-69117 Heidelberg, Germany
关键词
EXTREME-ULTRAVIOLET; LASER; SPECTROSCOPY; GENERATOR; STATES; PHASE; LINE;
D O I
10.1038/NPHOTON.2014.113
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Optical frequency combs have had a remarkable impact on precision spectroscopy(1-3). Enabling this technology in the X-ray domain is expected to result in wide-ranging applications, such as stringent tests of astrophysical models and quantum electrodynamics(4), a more sensitive search for the variability of fundamental constants(5), and precision studies of nuclear structure(6). Ultraprecise X-ray atomic clocks may also be envisaged(7). In this work, an X-ray pulse-shaping method is proposed to generate a comb in the absorption spectrum of an ultrashort high-frequency pulse. The method employs an optical-frequency-comb laser, manipulating the system's dipole response to imprint a comb on an excited transition with a high photon energy. The described scheme provides higher comb frequencies and requires lower optical-comb peak intensities than currently explored methods(8-10), preserves the overall width of the optical comb, and may be implemented using currently available X-ray technology(11).
引用
收藏
页码:520 / 523
页数:4
相关论文
共 50 条
  • [21] High-resolution X-ray spectroscopy of θ Carinae
    Naze, Y.
    Rauw, G.
    ASTRONOMY & ASTROPHYSICS, 2008, 490 (02) : 801 - 806
  • [22] HIGH-RESOLUTION IMAGING X-RAY DETECTOR
    KELLOGG, E
    HENRY, P
    MURRAY, S
    VANSPEYBROECK, L
    BJORKHOLM, P
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1976, 47 (03): : 282 - 290
  • [23] High-resolution compact X-ray microscopy
    Takman, P. A. C.
    Stollberg, H.
    Johansson, G. A.
    Holmberg, A.
    Lindblom, M.
    Hertz, H. M.
    JOURNAL OF MICROSCOPY, 2007, 226 (02) : 175 - 181
  • [24] A 'static' high-resolution X-ray diffractometer
    Fewster, PF
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2005, 38 : 62 - 68
  • [25] HIGH-RESOLUTION X-RAY AND ELECTRON SPECTROMETER
    ELAD, E
    NAKAMURA, M
    NUCLEAR INSTRUMENTS & METHODS, 1966, 41 (01): : 161 - +
  • [26] HIGH-RESOLUTION X-RAY SPECTROSCOPY AT JET
    GIANNELLA, R
    JOURNAL DE PHYSIQUE, 1988, 49 (C-1): : 283 - 291
  • [27] HIGH-RESOLUTION X-RAY PROJECTION MICROSCOPY
    NIXON, WC
    PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1955, 232 (1191): : 475 - &
  • [28] HIGH-RESOLUTION X-RAY CHARACTERIZATION OF MATERIALS
    LISCHKA, K
    FANTNER, EJ
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 58 (03): : 119 - 120
  • [29] High-resolution X-ray diffraction and imaging
    Fewster, Paul F.
    Baidakova, Marina V.
    Kyutt, Reginald
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2013, 46 : 841 - 841
  • [30] High-resolution X-ray spectroscopy of astrophysical plasmas with X-ray microcalorimeters
    Ezoe Y.
    Ohashi T.
    Mitsuda K.
    Reviews of Modern Plasma Physics, 5 (1)