Evaluation of moderately focused laser irradiation as a method for simulating single-event effects

被引：7
|
作者：
Chumakov A.I. [1 ]
Egorov A.N. [2 ]
Mavritsky O.B. [2 ]
Yanenko A.V. [1 ]
机构：
[1] Specialized Electronic Systems, Moscow, 115409
[2] Moscow Inst. of Engineering Physics, Moscow
来源：
Russian Microelectronics | 2004年 / 33卷 / 2期
关键词：
Energy Transfer; Laser Irradiation; Laser Spot; Spot Diameter; Linear Energy Transfer;
D O I：
10.1023/B:RUMI.0000018715.45935.79
中图分类号：
学科分类号：
摘要：
A numerical and a physical simulation are reported of single-event upsets and single-event latchups by laser irradiation with spot diameters ranging from 5 to 50 μm. It is shown that the method can be useful for estimating the threshold values of linear energy transfer if the laser spot covers a number of sensitive regions.
引用
收藏
页码：106 / 110
页数：4
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