Low-energy electron mean free path in thin films of copper phthalocyanine

被引：0
|
作者：
S. A. Komolov
É. F. Lazneva
A. S. Komolov
机构：
[1] St. Petersburg State University,Institute of Physics
来源：
Technical Physics Letters | 2003年 / 29卷
关键词：
Free Path; Phthalocyanine; Deposit Thickness; Organic Film; Current Spectrum;
D O I：
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中图分类号：
学科分类号：
摘要：
The formation of thin organic films of copper phthalocyanine (CuPc) deposited onto the surface of gold-coated quartz crystal resonator was studied in situ under ultrahigh vacuum conditions by means of total electron-beam-induced current spectroscopy in combination with deposit thickness determination by piezocrystal microbalance technique. Variations in the fine structure of the total current spectra of CuPc layers of var-ious thicknesses in the 0–8 nm interval have been analyzed and the electron mean free path in thin CuPc films was determined as a function of the electron energy. For electron energies of 5.0, 7.2, 14.4, and 18.0 eV above the Fermi level, the mean free path is 6.4, 3.9, 2.6, and 2.3 nm.
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页码：974 / 976
页数：2
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