Ferroelectric memory based on nanostructures

被引:0
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作者
Xingqiang Liu
Yueli Liu
Wen Chen
Jinchai Li
Lei Liao
机构
[1] Wuhan University,Key Laboratory of Artificial Micro
[2] Wuhan University of Technology, and Nano
关键词
Gate Voltage; Memory Device; Remnant Polarization; Binary State; Hysteretic Loop;
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学科分类号
摘要
In the past decades, ferroelectric materials have attracted wide attention due to their applications in nonvolatile memory devices (NVMDs) rendered by the electrically switchable spontaneous polarizations. Furthermore, the combination of ferroelectric and nanomaterials opens a new route to fabricating a nanoscale memory device with ultrahigh memory integration, which greatly eases the ever increasing scaling and economic challenges encountered in the traditional semiconductor industry. In this review, we summarize the recent development of the nonvolatile ferroelectric field effect transistor (FeFET) memory devices based on nanostructures. The operating principles of FeFET are introduced first, followed by the discussion of the real FeFET memory nanodevices based on oxide nanowires, nanoparticles, semiconductor nanotetrapods, carbon nanotubes, and graphene. Finally, we present the opportunities and challenges in nanomemory devices and our views on the future prospects of NVMDs.
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