Air-coupled linear and sparse cMUT array manufactured using MUMPs process

被引:0
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作者
Alberto Octavio
Richard L. O’Leary
Simon M. Whiteley
Óscar Martínez-Graullera
Carlos J. Martín-Arguedas
Luis Gómez-Ullate
Francisco Montero de Espinosa
机构
[1] Universidad de Castilla-La Mancha,Dept. Ingeniería Eléctrica, Electrónica, Automática y Comunicaciones, INAMOL, Campus Tecnológico de la Antigua Fábrica de Armas
[2] Centro de Acústica Aplicada y Evaluación no Destructiva,Center for Ultrasonic Engineering
[3] Consejo Superior de Investigaciones Científicas (CAEND-UPM/CSIC),undefined
[4] University of Strathclyde,undefined
来源
Microsystem Technologies | 2011年 / 17卷
关键词
Polysilicon; Array Element; Parasitic Capacitance; Laser Doppler Vibrometer; Electrical Loss;
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中图分类号
学科分类号
摘要
An assessment of the standard fabrication Micro-Electro-Mechanical Systems (MEMS) process Multi-User MEMS Processes (MUMPs) for complex air-coupled capacitive Micromachined Ultrasonic Transducer array aperture manufacture is reported. A 1-D linear array and a 2-D sparse symmetric binned-array have been designed and manufactured, and then characterised experimentally using electrical impedance measurements, laser vibrometry and air-coupled field measurement; the experimental data are supported by simulated data using Finite Element technique and field simulation based on Huygens’ principle. A methodology for the manufacture of the array structures using the MUMPs process is described. Electrical characterisation shows the devices operation at 770 kHz and the existence of large parasitic capacitances and electrical losses. Mechanical crosstalk of array substrate has been measured at −40 dB using laser vibrometry. Moreover, the laser vibrometry measurement and the field characteristics of one element reveal that each element operates as a piston radiator.
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