Characterisation of gold nanoparticles and rods using high angle annular dark field imaging

被引:0
|
作者
Robert D. Boyd
Tim J. Young
Vlad Stolojan
机构
[1] The National Physical Laboratory,Advanced Technology Institute
[2] University of Surrey,undefined
来源
关键词
Gold nanorods; STEM; HAADF; Dimensional characterisation; Instrumentation;
D O I
暂无
中图分类号
学科分类号
摘要
This study demonstrates use of high angle annular dark field (HAADF) imaging for the characterisation of gold nano-objects. HAADF, which is based on scanning transmission electron microscopy (STEM), has been used to measure gold spherical colloids and 1:6 aspect ratio gold nanorods. It has been demonstrated that this approach offers a realistic way of representing the dimensions (length, width and height) of a statistically relevant number of nano-objects (at least 200) in a realistic period of time. This new approach does not involve tilting the sample and as such, is more time efficient than traditional electron tomography and does not require sophisticated software analysis.
引用
收藏
相关论文
共 50 条
  • [31] Detection of large thermal vibration for Cu atoms in tetrahedrite by high-angle annular dark-field imaging
    Mishra, Tara Prasad
    Koyano, Mikio
    Oshima, Yoshifumi
    APPLIED PHYSICS EXPRESS, 2017, 10 (04)
  • [32] Effect of small crystal tilt on atomic-resolution high-angle annular dark field STEM imaging
    Yamazaki, T
    Kawasaki, M
    Watanabe, K
    Hashimoto, I
    Shiojiri, M
    ULTRAMICROSCOPY, 2002, 92 (3-4) : 181 - 189
  • [33] Scaling the Dynamic Electron Scattering in Imaging the Graphene Sheets by the High-Angle Annular Dark-Field Microscopy
    Ding, W. F.
    Chen, T. S.
    Liao, K. M.
    He, L. B.
    Song, F. Q.
    Zhou, J. F.
    Wan, J. G.
    Wang, G. H.
    Han, M.
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2012, 12 (08) : 6494 - 6498
  • [34] ATOMIC IMAGING USING THE DARK-FIELD ANNULAR DETECTOR IN THE STEM
    ISAACSON, M
    KOPF, D
    OHTSUKI, M
    UTLAUT, M
    ULTRAMICROSCOPY, 1979, 4 (01) : 101 - 104
  • [35] Subangstrom resolution imaging using annular dark-field STEM
    Nellist, PD
    Pennycook, SJ
    ELECTRON MICROSCOPY AND ANALYSIS 1999, 1999, (161): : 315 - 318
  • [36] Variable-angle high-angle annular dark-field imaging: application to three-dimensional dopant atom profiling
    Jack Y. Zhang
    Jinwoo Hwang
    Brandon J. Isaac
    Susanne Stemmer
    Scientific Reports, 5
  • [37] Variable-angle high-angle annular dark-field imaging: application to three-dimensional dopant atom profiling
    Zhang, Jack Y.
    Hwang, Jinwoo
    Isaac, Brandon J.
    Stemmer, Susanne
    SCIENTIFIC REPORTS, 2015, 5
  • [38] Structural studies of decagonal quasicrystals and approximants using the high-angle annular dark-field method
    Saitoh, K
    Tsuda, K
    Tanaka, M
    Tsai, AP
    QUASICRYSTALS, 1999, 553 : 177 - 182
  • [39] Quantitative analysis of ultrathin doping layers in semiconductors using high-angle annular dark field images
    Liu, C.P.
    Preston, A.R.
    Boothroyd, C.B.
    Humphreys, C.J.
    Journal of Microscopy, 1999, 194 (01): : 171 - 182
  • [40] Quantitative analysis of ultrathin doping layers in semiconductors using high-angle annular dark field images
    Liu, CP
    Preston, AR
    Boothroyd, CB
    Humphreys, CJ
    JOURNAL OF MICROSCOPY-OXFORD, 1999, 194 : 171 - 182