Polarized Raman spectroscopy and X-ray diffuse scattering in InGaAs/GaAs(100) quantum-dot chains

被引:0
|
作者
V. V. Strelchuk
Yu. I. Mazur
Zh. M. Wang
M. Schmidbauer
O. F. Kolomys
M. Ya. Valakh
M. O. Manasreh
G. J. Salamo
机构
[1] University of Arkansas,Department of Physics
[2] NAS of Ukraine,Lashkaryov Institute of Semiconductor Physics
[3] Institut für Kristallzüchtung,Department of Electrical Engineering
[4] University of Arkansas,undefined
关键词
GaAs; Raman Spectrum; Phonon Line; Reciprocal Lattice Point; GaAs Matrix;
D O I
暂无
中图分类号
学科分类号
摘要
Using polarized Raman spectroscopy and high resolution X-ray diffraction we have investigated self-organized In0.45Ga0.55As quantum-dot chains in InGaAs/GaAs multilayer structures. It is shown that the formation of InGaAs QDs in InGaAs/GaAs multilayered structures is accompanied by a strong improvement in the uniformity of size and shapes of QDs as well as vertical alignment and lateral ordering. At mean densities, extended chains of QDs (up to 5 μm) appear along the \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$ [1\bar 10] $$\end{document} direction; however, increased ordering of QDs along the [110] direction could be observed, too. For the first time, InGaAs dot-chains were investigated using polarized Raman scattering. Observation of optical phonons localized in InGaAs QDs and two-dimensional (2D) layers is demonstrated. An obvious anisotropy in the intensity of Raman modes was observed when the electric field vector of the exciting laser beam is parallel or perpendicular to the wire-like axis \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$ [1\bar 10] $$\end{document} of dot-chains. This effect may be related to symmetry lowering effects and real anisotropic geometry of the QDs and 2D wetting layers.
引用
收藏
页码:692 / 698
页数:6
相关论文
共 50 条
  • [31] Coherent stimulated x-ray Raman spectroscopy: Attosecond extension of resonant inelastic x-ray Raman scattering
    Harbola, Upendra
    Mukamel, Shaul
    PHYSICAL REVIEW B, 2009, 79 (08)
  • [32] GaSb/GaAs quantum dot systems:: in situ synchrotron radiation x-ray photoelectron spectroscopy study
    Strocov, VN
    Cirlin, GE
    Sadowski, J
    Kanski, J
    Claessen, R
    NANOTECHNOLOGY, 2005, 16 (08) : 1326 - 1334
  • [34] Investigation of the interface roughness of GaAs single quantum wells by X-ray diffractometry, reflectivity and diffuse scattering
    Jenichen, B
    Hey, R
    Wassermeier, M
    Ploog, K
    NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA D-CONDENSED MATTER ATOMIC MOLECULAR AND CHEMICAL PHYSICS FLUIDS PLASMAS BIOPHYSICS, 1997, 19 (2-4): : 429 - 438
  • [35] Anomalous x-ray diffraction on InAs/GaAs quantum dot systems
    Schülli, TU
    Sztucki, M
    Chamard, V
    Metzger, TH
    Schuh, D
    APPLIED PHYSICS LETTERS, 2002, 81 (03) : 448 - 450
  • [36] X-ray Raman scattering: a building block for nonlinear spectroscopy
    Rohringer, Nina
    PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2019, 377 (2145):
  • [37] Inelastic X-ray scattering: new possibilities for Raman spectroscopy
    T. Ruf
    Applied Physics A, 2003, 76 : 21 - 26
  • [38] Inelastic X-ray scattering: new possibilities for Raman spectroscopy
    Ruf, T
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2003, 76 (01): : 21 - 26
  • [39] X-ray absorption spectroscopy and X-ray Raman scattering of water and ice; an experimental view
    Nilsson, A.
    Nordlund, D.
    Waluyo, I.
    Huang, N.
    Ogasawara, H.
    Kaya, S.
    Bergmann, U.
    Naeslund, L. -A.
    Ostrom, H.
    Wernet, Ph.
    Andersson, K. J.
    Schiros, T.
    Pettersson, L. G. M.
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2010, 177 (2-3) : 99 - 129
  • [40] X-ray double crystal diffractian study of InGaAs/GaAs quantum wells
    Yan, Y
    Xue, CY
    Zhang, BZ
    Zhang, WD
    ISTM/2005: 6th International Symposium on Test and Measurement, Vols 1-9, Conference Proceedings, 2005, : 2271 - 2273