Microwave dielectric properties of bismuth layer-structured Ca2−xSrxBi4Ti5O18 (0 ≤ x ≤ 0.6) ceramics

被引：0
|
作者：
Benben Niu
Weibing Ma
Qiang Li
Tiankai Chen
Zhengli Huan
Xueyuan Meng
Jianqiang Ma
机构：
[1] Tianjin University,Key Laboratory for Advanced Ceramics and Machining Technology of Ministry of Education
来源：
Journal of Materials Science: Materials in Electronics | 2015年 / 26卷
关键词：
Dielectric Constant; Relative Density; Bismuth; Sinter Temperature; Bi2O3;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Ceramics of five-layered Ca2Bi4Ti5O18 (CBT) exhibit relatively high dielectric constants at high frequency. In this study, Sr2+ ions were added to substitute Ca2+ ions so as to improve the microwave dielectric properties of CBT ceramics. Densification, microstructural evolution, and microwave dielectric properties of Ca2−xSrxBi4Ti5O18 (CSBT), with x ranging from 0.0 to 0.6, were investigated. Besides, relation of sintering temperature and microscopic structure was also investigated. With increasing levels of Sr2+ ions additions, the relative permittivity increases from 170 to 202 but Q × f decreases from 868 to 428 GHz. Typically, dielectric properties of εr = 180 and Q × f = 759 GHz were obtained for the Ca1.8Sr0.2Bi4Ti5O18 specimens sintered at 1,175 °C for 5 h.
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页码：916 / 920
页数：4
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