Multiple ionization under strong XUV to X-ray radiation

被引：0
|
作者：
P. Lambropoulos
G. M. Nikolopoulos
机构：
[1] FORTH,Institute of Electronic Structure & Laser
[2] University of Crete,Department of Physics
来源：
The European Physical Journal Special Topics | 2013年 / 222卷
关键词：
Photon Energy; European Physical Journal Special Topic; Free Electron Laser; Direct Channel; Double Ionization;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
We review the main aspects of multiple photoionization processes in atoms exposed to intense, short wavelength radiation. The main focus is the theoretical framework for the description of such processes as well as the conditions under which direct multiphoton multiple ionization processes can dominate over the sequential ones. We discuss in detail the mechanisms available in different wavelength ranges from the infrared to the hard X-rays. The effect of field fluctuations, present at this stage in all SASE free-electron-laser (FEL) facilities, as well as the effect of the interaction volume integration, are also discussed.
引用
收藏
页码：2067 / 2084
页数：17
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