Trapped-hole centers in MgO single crystals

The properties of the majority trapped-hole centers in MgO, such as g-factors, positions of absorption and luminescence bands, and temperatures of thermal destruction, have been analyzed with the emphasis on the observed regular trends and interrelations between the properties of these centers. Particular emphasis has been placed on the positively charged [Be]+ and [Ca]+ trapped-hole centers, which have a large cross section for recombination with conduction electrons. In these centers, a hole is localized at an oxygen ion near the impurity Be2+ or Ca2+ ion located at a regular cation site. The generation and transformation of defects due to the recombination of either relaxed conduction electrons with OH−-containing hole centers or cold and hot electrons with [Be]+ and [Ca]+ centers have been considered. Using the interrelation of the characteristics of hole centers and taking into account that the recombination emission band revealed at ∼6.8 eV is due to the Ca2+-containing centers that are stable below 50 K, the prospects for the EPR detection of the [Ca]+ center at T < 4.2 K have been discussed.