Tunneling of Microwave Radiation through Three-Layer Structures Containing Ferrite Layer

被引:0
|
作者
S. A. Afanas’ev
D. I. Sementsov
K. V. Sharipova
机构
[1] Ul’yanovsk State University,
来源
Technical Physics | 2019年 / 64卷
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:68 / 73
页数:5
相关论文
共 50 条
  • [31] Three-Layer Feedforward Structures Smoothly Approximating Polynomial Functions
    Nakamura, Yuichi
    Nakagawa, Masahiro
    ARTIFICIAL NEURAL NETWORKS (ICANN 2010), PT III, 2010, 6354 : 411 - +
  • [32] Diffracted transition radiation of a relativistic electron in a three-layer structure
    Blazhevich, S. V.
    Zagorodnyuk, R. A.
    Noskov, A. V.
    JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS, 2014, 119 (04) : 641 - 650
  • [34] Low cost and easily scalable microwave absorbing material based on three-layer honeycomb sandwich structures
    Indrusiak, Tamara
    Soares, Bluma G.
    Pereira, Iaci M.
    Pontes, Ketly
    Pereira, Elaine C. Lopes
    Moura, Luanna C. R.
    Migliano, Antonio C. C.
    MATERIALS TODAY COMMUNICATIONS, 2023, 35
  • [35] Three-layer electrochromic system
    Klingler, M
    Chu, WF
    Weppner, W
    SOLAR ENERGY MATERIALS AND SOLAR CELLS, 1995, 39 (2-4) : 247 - 255
  • [36] Three-Layer Electrorefining of Silicon
    Espen Olsen
    Sverre Rolseth
    Metallurgical and Materials Transactions B, 2010, 41 : 295 - 302
  • [37] Dynamics of three-layer bars
    Starovoitov É.I.
    Leonenko D.V.
    Yarovaya A.V.
    Strength of Materials, 2006, 38 (6) : 668 - 679
  • [38] Breathers in a three-layer fluid
    Nakayama, K.
    Lamb, K. G.
    JOURNAL OF FLUID MECHANICS, 2020, 903
  • [39] Three-Layer Electrorefining of Silicon
    Olsen, Espen
    Rolseth, Sverre
    METALLURGICAL AND MATERIALS TRANSACTIONS B-PROCESS METALLURGY AND MATERIALS PROCESSING SCIENCE, 2010, 41 (02): : 295 - 302
  • [40] Microwave Switching in the Magnetic and Elastic Subsystems of a Three-Layer Magnetic Structure
    Kotov L.N.
    Dianov M.Y.
    Vlasov V.S.
    Mironov V.V.
    Bulletin of the Russian Academy of Sciences: Physics, 2023, 87 (04) : 409 - 415