An Apparatus for Measuring the High-Temperature Thermal Conductivity of Semiconductors and Their Melts

被引：0
|
作者：
Ya. B. Magomedov
G. G. Gadzhiev
机构：
[1] Russian Academy of Sciences,Institute of Physics, Dagestan Scientific Center
来源：
Instruments and Experimental Techniques | 2004年 / 47卷
关键词：
Oxidation; Physical Chemistry; Evaporation; Thermal Conductivity; Argon;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
An installation for investigating the thermal conductivity of semiconductors and their melts over a wide temperature range (300–1100 K) is described. In contrast to the devices used earlier for this purpose, the thermal conductivity was measured in a hermetically sealed autoclave filled after evacuation with spectroscopically pure argon to prevent the oxidation, evaporation, and decomposition of the substance under study. The error of thermal-conductivity measurements did not exceed 8% at 1000 K.
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页码：551 / 554
页数：3
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