Interface takes charge over Si

被引：0
|
作者：
Darrell G. Schlom
Jochen Mannhart
机构：
[1] Cornell University,Darrell G. Schlom is in the Department of Materials Science and Engineering
[2] Ithaca,undefined
[3] New York 14853-1501,undefined
[4] USA,undefined
[5] Jochen Mannhart is at the Center for Electronic Correlations and Magnetism,undefined
[6] University of Augsburg,undefined
[7] 86135 Augsburg,undefined
[8] Germany.,undefined
来源：
Nature Materials | 2011年 / 10卷
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摘要：
The formation of a two-dimensional electron liquid at the interface between two insulating oxides, now extended to oxides on Si, joins a wealth of observations that reveal how electron transfer between layers is responsible for this unusual effect.
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页码：168 / 169
页数：1
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