Ellipsometric control of the parameters of lead selenide films during oxidation

被引：0
|
作者：
V. V. Tomaev
M. F. Panov
机构：
[1] St. Petersburg State University of Electrical Engineering (LETI),
来源：
Glass Physics and Chemistry | 2006年 / 32卷
关键词：
PbTe; PbSe; Glass Physic; Glass Phys; Lead Chalcogenide;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The changes in the optical characteristics of lead selenide thin films with different degrees of oxidation are investigated using ellipsometry. It is found that, as the degree of oxidation increases, the refractive index, the optical thickness, and the extinction coefficient of lead selenide films decrease monotonically, whereas the effective film thickness increases. The composition of the films can be determined from the measured refractive index at a wavelength λ = 632.8 nm with the use of the dependences calculated on the basis of the single-layer model.
引用
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页码：370 / 373
页数：3
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