Planar channeling radiation by 20-800 MeV electrons in a thin silicon carbide

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作者
B. Azadegan
S. B. Dabagov
机构
[1] Sabzevar Tarbiat Moallem University,
[2] INFN Laboratori Nazionali di Frascati,undefined
[3] RAS P.N. Lebedev Physical Institute,undefined
关键词
Relativistic Electron; Interplanar Distance; Channeling; Miller Index; Crystal Thickness;
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摘要
We present spectral distributions of channeling radiation by 20-800MeV electrons for various planes of a thin 4H polytype silicon carbide crystal. The quantum theory of channeling radiation has been applied to calculate the transverse electron states in the continuum potential of crystal planes and to study the transition energies, linewidths, depth dependences of quantum states populations, and spectral radiation distributions. At electron energies higher than 100MeV the spectral distributions of emitted radiation have been calculated within the classical approach, and compared successfully with the quantum mechanical solutions. We discuss specific properties of planar channeling radiation in a 4H SiC polytype and find some new features of electron channeling in 4H SiC not available in other structures.
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