Precise half-life measurement of the 26Si ground state

被引：3
|
作者：
I. Matea
J. Souin
J. Äystö
B. Blank
P. Delahaye
V. -V. Elomaa
T. Eronen
J. Giovinazzo
U. Hager
J. Hakala
J. Huikari
A. Jokinen
A. Kankainen
I. D. Moore
J. -L. Pedroza
S. Rahaman
J. Rissanen
J. Ronkainen
A. Saastamoinen
T. Sonoda
C. Weber
机构：
[1] Université Bordeaux 1 - UMR 5797 CNRS/IN2P3,Centre d’Études Nucléaires de Bordeaux Gradignan
[2] CSIC,Instituto Estructura de la Materia
[3] Serrano 113bis,Department of Physics
[4] University of Jyväskylä,undefined
[5] CERN,undefined
来源：
The European Physical Journal A | 2008年 / 38卷 / 2期
关键词：
D O I：
10.1140/epja/i2008-10678-2
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：247 / 247
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