XPS depth profiling investigations on La2Zr2O7 layers prepared by chemical solution deposition

La2Zr2O7 (LZO) layers have been recently investigated as potential buffer layers for superconducting YBa2Cu3O7–x coated conductors deposited on Ni tapes. Chemical solution deposition was used for LZO layer preparation. X-ray photoelectron spectroscopy (XPS) depth profiling is demonstrated to be an important method for layer characterization in addition to X-ray diffraction techniques. XPS measurements revealed layers that are homogeneous in depth, very smooth, and have no significant impurities. A slight difference to the nominal La:Zr stoichimetry is discussed in combination with structural defects that are suspected from spectral changes during ion sputtering.