XPS depth profiling investigations on La2Zr2O7 layers prepared by chemical solution deposition

被引：0
|
作者：
Steffen Oswald
Kerstin Knoth
Bernhard Holzapfel
机构：
[1] IFW Dresden Leibniz-Institut für Festkörper und Werkstoffforschung,
来源：
Microchimica Acta | 2006年 / 156卷
关键词：
Key words: X-ray photoelectron spectroscopy; depth profiling; chemical solution deposition; LZO-buffer layer; YBCO coated conductors.;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
La2Zr2O7 (LZO) layers have been recently investigated as potential buffer layers for superconducting YBa2Cu3O7–x coated conductors deposited on Ni tapes. Chemical solution deposition was used for LZO layer preparation. X-ray photoelectron spectroscopy (XPS) depth profiling is demonstrated to be an important method for layer characterization in addition to X-ray diffraction techniques. XPS measurements revealed layers that are homogeneous in depth, very smooth, and have no significant impurities. A slight difference to the nominal La:Zr stoichimetry is discussed in combination with structural defects that are suspected from spectral changes during ion sputtering.
引用
收藏
页码：121 / 124
页数：3
相关论文
共 50 条
  • [1] XPS depth profiling investigations on La2Zr2O7 layers prepared by chemical solution deposition
    Oswald, Steffen
    Knoth, Kerstin
    Holzapfel, Bernhard
    MICROCHIMICA ACTA, 2006, 156 (1-2) : 121 - 124
  • [2] Detailed investigations on La2Zr2O7 buffer layers for YBCO-coated conductors prepared by chemical solution deposition
    Knoth, K.
    Huehne, R.
    Oswald, S.
    Schultz, L.
    Holzapfel, B.
    ACTA MATERIALIA, 2007, 55 (02) : 517 - 529
  • [3] Deposition of La2Zr2O7 film by chemical solution deposition
    Yu, Z. M.
    Odier, P.
    Morlens, S.
    Chaudouet, P.
    Bacia, M.
    Zhou, L.
    Zhang, P. X.
    Jin, L. H.
    Li, C. S.
    David, P.
    Fruchart, O.
    Lu, Y. F.
    JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, 2010, 54 (03) : 363 - 370
  • [4] Deposition of La2Zr2O7 film by chemical solution deposition
    Z. M. Yu
    P. Odier
    S. Morlens
    P. Chaudouët
    M. Bacia
    L. Zhou
    P. X. Zhang
    L. H. Jin
    C. S. Li
    P. David
    O. Fruchart
    Y. F. Lu
    Journal of Sol-Gel Science and Technology, 2010, 54 : 363 - 370
  • [5] Fabrication of La2Zr2O7 thick layers by chemical solution deposition for coated conductors
    Wang, Rong
    Suo, Hong-Li
    Cheng, Yan-Ling
    Liu, Min
    Zhao, Yue
    Ye, Shuai
    Gao, Mang-Mang
    Zhou, Mei-Ling
    Rengong Jingti Xuebao/Journal of Synthetic Crystals, 2010, 39 (02): : 396 - 400
  • [6] Growth and characterization of La2Zr2O7 buffer layers deposited by chemical solution deposition
    Armenio, A. Angrisani
    Augieri, A.
    Fabbri, F.
    Freda, R.
    Galluzzi, V.
    Mancini, A.
    Rizzo, F.
    Rufoloni, A.
    Vannozzi, A.
    Sotgiu, G.
    Pompeo, N.
    Torokhtii, K.
    Silva, E.
    Bemporad, E.
    Contini, G.
    Celentano, G.
    SUPERCONDUCTIVITY CENTENNIAL CONFERENCE 2011, 2012, 36 : 1552 - 1557
  • [7] Optimisation of single La2Zr2O7 buffer layers for YBCO coated conductors prepared by chemical solution deposition
    Engel, S.
    Huehne, R.
    Knoth, K.
    Chopra, A.
    Kumar, N. H.
    Sarma, V. S.
    Santhosh, P. N.
    Schultz, L.
    Holzapfel, B.
    JOURNAL OF CRYSTAL GROWTH, 2008, 310 (18) : 4295 - 4300
  • [8] Investigation on La2Zr2O7 multilayers by chemical solution deposition
    Ren, C.
    Suo, H. L.
    Liu, M.
    Tian, H.
    Liang, Y. R.
    Xu, Y.
    Yi, N.
    CERAMICS INTERNATIONAL, 2017, 43 (06) : 5041 - 5046
  • [9] Highly textured La2Zr2O7 buffer layers for YBCO-coated conductors prepared by chemical solution deposition
    Knoth, K
    Hühne, R
    Oswald, S
    Schultz, L
    Holzapfel, B
    SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2005, 18 (03): : 334 - 339
  • [10] Chemical solution deposition of La2Zr2O7 and Y2Ti2O7 buffer layers on NiW substrates
    Zhu, XB
    Sun, YP
    Song, WH
    Yang, J
    Gu, HW
    PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2006, 433 (3-4): : 154 - 159
12345