Step-confined thin film growth via near-surface atom migration

被引:0
|
作者
Caixia Meng
Junfeng Gao
Rongtan Li
Yanxiao Ning
Yuan Chang
Rentao Mu
Qiang Fu
Xinhe Bao
机构
[1] Chinese Academy of Sciences,State Key Laboratory of Catalysis, Dalian Institute of Chemical Physics
[2] University of Chinese Academy of Sciences,Key Laboratory of Materials Modification by Laser, Ion and Electron Beams
[3] Dalian University of Technology,undefined
[4] Ministry of Education,undefined
[5] University of Science and Technology of China,undefined
来源
Nano Research | 2020年 / 13卷
关键词
thin film growth; tungsten carbide; near-surface dopant; low-energy electron microscopy (LEEM); step confinement;
D O I
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学科分类号
摘要
Understanding of thin film growth mechanism is crucial for tailoring film growth behaviors, which in turn determine physicochemical properties of the resulting films. Here, vapor-growth of tungsten carbide overlayers on W(110) surface is investigated by real time low energy electron microscopy. The surface growth is strongly confined by surface steps, which is in contrast with overlayer growth crossing steps in a so-called carpet-like growth mode for example in graphene growth on metal surfaces. Density functional theory calculations indicate that the step-confined growth is caused by the strong interaction of the forming carbide overlayer with the substrate blocking cross-step growth of the film. Furthermore, the tungsten carbide growth within each terrace is facilitated by the supply of carbon atoms from near-surface regions at high temperatures. These findings suggest the critical role of near-surface atom diffusion and step confinement effects in the thin film growth, which may be active in many film growth systems.
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页码:1552 / 1557
页数:5
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