The extended Erlang-truncated exponential distribution under CUSUM control charts for one sided

被引:0
|
作者
Sayyed M. [1 ]
Sayyed F. [2 ]
Sharma R.M. [1 ]
机构
[1] College of Agriculture, JNKVV, MP, GanjBasoda
[2] Department of Applied Science, SAGE University, Indore
关键词
Average run length (ARL); Cumulative sum (CUSUM) control chart; Extended Erlang-truncated exponential distribution; Sequential probability ratio test (SPRT);
D O I
10.1007/s41872-022-00210-6
中图分类号
学科分类号
摘要
The CUSUM control chart kept the process on target. According to the explanation of this chart, the cumulative sum is defined as an average of subgroups from the target. This cumulative sum plot against to time and if the process goes out of control, then it will signal that, i.e. the process is signed off of the target. In this research work, we have investigated CUSUM control chart for the extended Erlang-truncated exponential (EETE) distribution. The EETE distribution is the modified form of Erlang-truncated exponential (ETE) distribution and EETE distribution is also refer as the life time ETE distribution. These families of distributions belongs to the exponential distribution. The ETE distribution can be applied to stochastic processes and is frequently utilized in the field of queuing systems. Sequential probability ratio test is used for the construction of variable cumulative sum control chart. Early process shifts are detected via the CUSUM chart. It is observed that if there was even a small change in the distribution under study, V-mask and average run length (parameters of the distribution) changed. © 2022, This is a U.S. Government work and not under copyright protection in the US; foreign copyright protection may apply.
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收藏
页码:65 / 69
页数:4
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