Effects of Annealing on the Microstructure and Thermoelectric Properties of Half-Heusler MNiSn (M = Ti, Zr, Hf)

被引：0
|
作者：
Gitae Park
Ho Seong Lee
Seonghoon Yi
机构：
[1] Kyungpook National University,Department of Materials Science and Metallurgical Engineering
来源：
Journal of Electronic Materials | 2022年 / 51卷
关键词：
Half-Heusler phase; thermoelectric; annealing; anti-site defect; phonon scattering;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
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页码：3485 / 3494
页数：9
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