Statistical delay of microplasma breakdown in GaP p-n junctions

被引:0
|
作者
S. V. Bulyarskii
Yu. N. Serëzhkin
V. K. Ionychev
机构
[1] Ulyanovsk State University,
[2] Mordovian State University,undefined
来源
Semiconductors | 1999年 / 33卷
关键词
Experimental Study; Distribution Function; Energy Level; Energy Spectrum; Gallium;
D O I
暂无
中图分类号
学科分类号
摘要
The mechanism for switching on a microplasma in gallium phosphide p-n junctions is investigated. It is shown that changing the distribution function of the statistical breakdown delay with respect to distance makes it possible to determine the energy spectrum of deep levels localized in the microplasma channels. In these experimental studies, commercial gallium phosphide AL102 red-light LEDs were used. In the temperature range 100–380 K the influence of a number of energy levels was detected. In these diodes, deep levels were observed to have an unusually strong effect on the statistical breakdown delay when their charge states are changed by a fractional decrease in the voltage across the p-n junction.
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页码:1216 / 1220
页数:4
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