共 50 条
- [21] A new multiple dependent state sampling plan based on one-sided process capability indices INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2023, 126 (7-8): : 3297 - 3309
- [23] Bayesian approach for measuring EEPROM process capability based on the one-sided indices CPU and CPL The International Journal of Advanced Manufacturing Technology, 2006, 31 : 135 - 144
- [24] A new multiple dependent state sampling plan based on one-sided process capability indices The International Journal of Advanced Manufacturing Technology, 2023, 126 : 3297 - 3309
- [25] Bayesian approach for measuring EEPROM process capability based on the one-sided indices CPU and CPL INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2006, 31 (1-2): : 135 - 144
- [26] One-Sided Synthetic-RZ control charts: a new method for anomaly detection PROCEEDINGS OF 2019 6TH NATIONAL FOUNDATION FOR SCIENCE AND TECHNOLOGY DEVELOPMENT (NAFOSTED) CONFERENCE ON INFORMATION AND COMPUTER SCIENCE (NICS), 2019, : 262 - 267
- [29] Two stochastic properties of one-sided exponentially weighted moving average control charts Communications in Statistics Part B: Simulation and Computation, 27 (04): : 937 - 952