Ion source with magnetic field for time-of-flight mass spectrometry

被引：0
|
作者：
V. I. Karataev
N. N. Aruev
机构：
[1] Russian Academy of Sciences,Ioffe Physical Technical Institute
来源：
Technical Physics Letters | 2011年 / 37卷
关键词：
Magnetic Field Strength; Technical Physic Letter; Ionization Zone; High Analytical Performance; Electron Impact Ionization Source;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A new ion source for the time-of-flight mass spectrometer (TOFMS) with electron-impact ionization and built-in permanent magnet for electron-beam focusing is described. The focusing of electrons in a homogeneous field leads to an increase in the resolving power and sensitivity of the TOFMS. A spectrometer with the proposed source can operate at electron energies within the 7–100-eV range. The method of suppressing spurious lines in the mass spectrum is described, which is based on a decrease in the energy of ionizing electrons.
引用
收藏
页码：575 / 578
页数：3
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