Test Technology Newsletter - December 2007[inline-graphic not available: see fulltext]The Newsletter of the Test Technology Technical Council of the IEEE Computer Society[inline-graphic not available: see fulltext]

被引：0

作者：

Bruce Kim

机构：

[1] University of Alabama,Department of Electrical and Computer Engineering

来源：

Journal of Electronic Testing | 2007年 / 23卷 / 6期

关键词：

D O I：

10.1007/s10836-007-5058-7

中图分类号：

学科分类号：

摘要：

引用

页码：467 / 468

页数：1

共 50 条

[1] Test Technology Newsletter[inline-graphic not available: see fulltext] The Newsletter of the Test Technology Technical Council of the IEEE Computer Society [inline-graphic not available: see fulltext]
Bruce C. Kim
Journal of Electronic Testing, 2007, 23 (1) : 9 - 10
[2] Test Technology Newsletter - October 2007[inline-graphic not available: see fulltext] The Newsletter of the Test Technology Technical Council of the IEEE Computer Society [inline-graphic not available: see fulltext]
Bruce Kim
Journal of Electronic Testing, 2007, 23 (5) : 371 - 372
[3] Test Technology Newsletter April 2007[inline-graphic not available: see fulltext]The Newsletter of the Test Technology Technical Council of the IEEE Computer Society[inline-graphic not available: see fulltext]
Bruce Kim
Journal of Electronic Testing, 2007, 23 (2-3) : 113 - 114
[4] Test Technology Newsletter February 2008[inline-graphic not available: see fulltext]The Newsletter of the Test Technology Technical Council of the IEEE Computer Society[inline-graphic not available: see fulltext]
Journal of Electronic Testing, 2008, 24 (1-3) : 5 - 6
[5] Test Technology Newsletter [inline-graphic not available: see fulltext][inline-graphic not available: see fulltext]
Journal of Electronic Testing, 2010, 26 (3) : 295 - 296
[6] Test Technology Newsletter[inline-graphic not available: see fulltext] August 2007 The Newsletter of the Test Technology Technical Council of the IEEE Computer SocietyEditor: Bruce Kim[inline-graphic not available: see fulltext]
Journal of Electronic Testing, 2007, 23 (4) : 273 - 274
[7] Test Technology Newsletter[inline-graphic not available: see fulltext] June 2006 The Newsletter of the Test Technology Technical Council of the IEEE Computer SocietyEditor: Bruce Kim[inline-graphic not available: see fulltext]
Journal of Electronic Testing, 2006, 22 (3) : 217 - 218
[8] Test Technology Newsletter[inline-graphic not available: see fulltext] August 2006 The Newsletter of the Test Technology Technical Council of the IEEE Computer SocietyEditor: Bruce Kim[inline-graphic not available: see fulltext]
Journal of Electronic Testing, 2006, 22 (4-6) : 309 - 310
[9] Test Technology Newsletter[inline-graphic not available: see fulltext]
Journal of Electronic Testing, 2010, 26 (5) : 497 - 498
[10] BHA[inline-graphic not available: see fulltext][inline-graphic not available: see fulltext]OJI D[inline-graphic not available: see fulltext]k[inline-graphic not available: see fulltext]Ita On Spho[inline-graphic not available: see fulltext]A
Johannes Bronkhorst
Journal of Indian Philosophy, 2005, 33 (1) : 3 - 41

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