Test Technology Newsletter[inline-graphic not available: see fulltext] August 2007 The Newsletter of the Test Technology Technical Council of the IEEE Computer SocietyEditor: Bruce Kim[inline-graphic not available: see fulltext]

被引：0

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来源：

Journal of Electronic Testing | 2007年 / 23卷 / 4期

关键词：

Fault Tolerance; Register Transfer Level; IEEE Design; Test Symposium; Design Abstraction;

D O I：

10.1007/s10836-007-0778-2

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引用

页码：273 / 274

页数：1

共 50 条

[1] Test Technology Newsletter[inline-graphic not available: see fulltext] August 2006 The Newsletter of the Test Technology Technical Council of the IEEE Computer SocietyEditor: Bruce Kim[inline-graphic not available: see fulltext]
Journal of Electronic Testing, 2006, 22 (4-6) : 309 - 310
[2] Test Technology Newsletter[inline-graphic not available: see fulltext] June 2006 The Newsletter of the Test Technology Technical Council of the IEEE Computer SocietyEditor: Bruce Kim[inline-graphic not available: see fulltext]
Journal of Electronic Testing, 2006, 22 (3) : 217 - 218
[3] Test Technology Newsletter[inline-graphic not available: see fulltext] The Newsletter of the Test Technology Technical Council of the IEEE Computer Society [inline-graphic not available: see fulltext]
Bruce C. Kim
Journal of Electronic Testing, 2007, 23 (1) : 9 - 10
[4] Test Technology Newsletter - December 2007[inline-graphic not available: see fulltext]The Newsletter of the Test Technology Technical Council of the IEEE Computer Society[inline-graphic not available: see fulltext]
Bruce Kim
Journal of Electronic Testing, 2007, 23 (6) : 467 - 468
[5] Test Technology Newsletter - October 2007[inline-graphic not available: see fulltext] The Newsletter of the Test Technology Technical Council of the IEEE Computer Society [inline-graphic not available: see fulltext]
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Journal of Electronic Testing, 2007, 23 (5) : 371 - 372
[6] Test Technology Newsletter April 2007[inline-graphic not available: see fulltext]The Newsletter of the Test Technology Technical Council of the IEEE Computer Society[inline-graphic not available: see fulltext]
Bruce Kim
Journal of Electronic Testing, 2007, 23 (2-3) : 113 - 114
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[8] Test Technology Newsletter February 2008[inline-graphic not available: see fulltext]The Newsletter of the Test Technology Technical Council of the IEEE Computer Society[inline-graphic not available: see fulltext]
Journal of Electronic Testing, 2008, 24 (1-3) : 5 - 6
[9] Test Technology Newsletter[inline-graphic not available: see fulltext]
Journal of Electronic Testing, 2010, 26 (5) : 497 - 498
[10] BHA[inline-graphic not available: see fulltext][inline-graphic not available: see fulltext]OJI D[inline-graphic not available: see fulltext]k[inline-graphic not available: see fulltext]Ita On Spho[inline-graphic not available: see fulltext]A
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