Forensic Characterization of Lipsticks Using Time-of-Flight Secondary Ion Mass Spectrometry

被引：0
|
作者：
Jihye Lee
Yeonhee Lee
机构：
[1] Advanced Analysis Center,
[2] Korea Institute of Science and Technology,undefined
来源：
Journal of Analytical Chemistry | 2021年 / 76卷
关键词：
trace evidence; lipstick; time-of-flight secondary ion mass spectrometry; ATR-FTIR; surface analysis;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
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页码：854 / 867
页数：13
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