Effect of holding time on the dielectric properties and non-ohmic behavior of CaCu3Ti4O12 capacitor-varistors

被引:0
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作者
Yanmin Huang
Danping Shi
Yunhua Li
Guizhong Li
Quanchao Wang
Laijun Liu
Liang Fang
机构
[1] Guilin University of Technology,State Key Laboratory Breeding Base of Nonferrous Metals and Specific Materials Processing, Key laboratory of Nonferrous Materials and New Processing Technology, Ministry of Education
[2] Jiangxi Vocational College of Applied Technology,Department of Mechanical and Electronic Engineering
[3] Guangxi New Future Information Industry Co.,undefined
[4] LTD,undefined
关键词
Barrier Height; Dielectric Permittivity; Schottky Barrier; Breakdown Voltage; Cool Method;
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学科分类号
摘要
Giant dielectric ceramics CaCu3Ti4O12 (CCTO) with non-ohmic electrical properties were prepared by a sol–gel processing method. Crystal structure and microstructure of the ceramics have been characterized using X-ray diffraction and Scanning electron microscopy. The effects of sintering duration and cooling rate on electrical properties of the ceramics were investigated by measuring the properties of permittivity, I–V and grain-boundary barriers. Prolonging holding time led to substantial improvement in permittivity, furthermore, the quenched sample showed larger dielectric permittivity than the furnace-cooling one. The non-ohmic behavior relating current density (J) to the applied electric field (E) at different temperatures was characterized. A low-voltage and giant dielectric permittivity CCTO varistor with breakdown voltages in the range of Eb = 0.2–3 kV cm−1, nonlinearity coefficient α = 2–6 and dielectric permittivity ε = 4,000–30,000 was obtained. A linear relationship between ln(J) and E1/2 indicated that a Schottky barrier should exist at the grain boundary.
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页码:1994 / 1999
页数:5
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