Near-Field Scanning Microwave Microscopy in the Single Photon Regime

被引：0
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作者：
S. Geaney
D. Cox
T. Hönigl-Decrinis
R. Shaikhaidarov
S. E. Kubatkin
T. Lindström
A. V. Danilov
S. E. de Graaf
机构：
[1] National Physical Laboratory,Royal Holloway
[2] University of London,Advanced Technology Institute
[3] The University of Surrey,Department of Microtechnology and Nanoscience
[4] Chalmers University of Technology,undefined
来源：
Scientific Reports | / 9卷
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摘要：
The microwave properties of nano-scale structures are important in a wide variety of applications in quantum technology. Here we describe a low-power cryogenic near-field scanning microwave microscope (NSMM) which maintains nano-scale dielectric contrast down to the single microwave photon regime, up to 109 times lower power than in typical NSMMs. We discuss the remaining challenges towards developing nano-scale NSMM for quantum coherent interaction with two-level systems as an enabling tool for the development of quantum technologies in the microwave regime.
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