Collection mode near-field scanning microwave microscopy

被引:5
|
作者
Cortes, R. [1 ]
Coello, V. [1 ]
Arriaga, R. [2 ]
Elizondo, N. [2 ]
机构
[1] PIIT, CICESE, Apodaca Nuevo Leon, Mexico
[2] UANL, FCFM, San Nicolas De Los Garza, Nuevo Leon, Mexico
来源
OPTIK | 2014年 / 125卷 / 10期
关键词
Scanning near field microwave microscopy; Dipole-like resonance; Dyadic Green's; EVANESCENT WAVES; SCATTERING; POLARIZATION; RESOLUTION; PROBE;
D O I
10.1016/j.ijleo.2013.10.085
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Collection mode near-field microscopy is demonstrated using a 10.56 GHz (X-band) frequency illumination. Imaging of a standing evanescent microwave was experimentally used to evaluate the capabilities of the microscope. The microscope functionality was validated by imaging near field interactions of different systems of dipole-like resonances. We prove that those microscope images contain near-field information by presenting numerical modeling of dipole-like resonant interactions. The model makes use of an analytic Dyadic Green's which is based in the near-field electrostatic approximation. We propose that this microscopy technique can be used, with certain limitations, as a check for 2D mapping of designed (spoof) surface plasmon at microwave frequencies. (c) 2013 Elsevier GmbH. All rights reserved.
引用
收藏
页码:2400 / 2404
页数:5
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